Yannick Deshayes: search on Z-Library

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1

[IEEE 2015 IEEE Aerospace Conference - Big Sky, MT, USA (2015.3.7-2015.3.14)] 2015 IEEE Aerospace Conference - Monte-carlo computations for predicted degradation of photonic devices in space environment

Bechou, Laurent, Deshayes, Yannick, Ousten, Yves, Gilard, Olivier, Quadri, Gianandrea, Lip Sun How,

Year:

2015

Language:

english

File:

PDF, 2.71 MB

english, 2015

2

Failure Mechanisms in Packaged Light-Emitting Diodes Under Gamma Radiations: Piezoelectric Model Based on Stark Effect

Deshayes, Yannick, Baillot, Raphaël, Rehioui, Othman, Béchou, Laurent, Ousten, Yves, Gilard, Olivier

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 969 KB

english, 2011

3

Simulations of Thermomechanical Stresses and Optical Misalignment in 1550-nm Transmitter Optoelectronic Modules Using FEM and Process Dispersions

Deshayes, Yannick, Bechou, Laurent, Verdier, F., Ousten, Yves, Laffitte, D., Goudard, J. L.

Journal:

IEEE Transactions on Components and Packaging Technologies

Year:

2008

Language:

english

File:

PDF, 1.17 MB

english, 2008

4

Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage

Baillot, Raphael, Deshayes, Yannick, Ousten, Yves, Bechou, Laurent

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 722 KB

english, 2015

5

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Reliability of Optical Fiber Components, Devices, Systems, and Networks II - Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations

Deshayes, Yannick, Verdier, Frederic, Bechou, Laurent, Tregon, Bernard, Danto, Yves, Laffitte, Dominique, Goudard, Jean Luc, Limberger, Hans G., Matthewson, M. John

Year:

2004

Language:

english

File:

PDF, 750 KB

english, 2004

6

Overview on Sustainability, Robustness, and Reliability of GaN Single-Chip LED Devices

Deshayes, Yannick, Baillot, Raphael, Joly, Simon, Ousten, Yves, Bechou, Laurent

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 830 KB

english, 2015

7

Extended Modal Gain Measurement in DFB Laser Diodes

Vanzi, Massimo, Marcello, Giulia, Mura, Giovanna, Le Gales, Germain, Joly, Simon, Deshayes, Yannick, Bechou, Laurent

Journal:

IEEE Photonics Technology Letters

Year:

2017

Language:

english

File:

PDF, 479 KB

english, 2017

8

Silver Clusters Embedded in Glass as a Perennial High Capacity Optical Recording Medium

Arnaud Royon, Kevin Bourhis, Matthieu Bellec, Gautier Papon, Bruno Bousquet, Yannick Deshayes, Thierry Cardinal, Lionel Canioni

Journal:

Advanced Materials

Year:

2010

Language:

english

File:

PDF, 404 KB

english, 2010

9

Reliability, Robustness and Failure Mechanisms of LED Devices || Physics of Failure Principles

Deshayes, Yannick

Year:

2016

Language:

english

File:

PDF, 4.00 MB

english, 2016

10

Proton effects on low noise and high responsivity silicon-based photodiodes for space environment

Pedroza, Guillaume, Gilard, Olivier, Bourqui, Marie-Lise, Bechou, Laurent, Deshayes, Yannick, How, Lip Sun, Rosala, François

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 860 KB

english, 2009

11

Reliability, Robustness and Failure Mechanisms of LED Devices || Analysis and Models of an LED

Deshayes, Yannick

Year:

2016

Language:

english

File:

PDF, 7.82 MB

english, 2016

12

Examination of femtosecond laser matter interaction in multipulse regime for surface nanopatterning of vitreous substrates

Varkentina, Nadezda, Cardinal, Thierry, Moroté, Fabien, Mounaix, Patrick, André, Pascal, Deshayes, Yannick, Canioni, Lionel

Journal:

Year:

2013

Language:

english

File:

PDF, 3.19 MB

english, 2013

13

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Sensors 2008 - Silicon phototransistor reliability assessment and new selection strategies for space applications

Spezzigu, Piero, Berghmans, Francis, Mignani, Anna G., Bechou, Laurent, Quadri, Gianandrea, Cutolo, Antonello, Meyrueis, Patrick P., Gilard, Olivier, Deshayes, Yannick, Pearsall, Thomas P., Ousten, Yv

Year:

2008

Language:

english

File:

PDF, 838 KB

english, 2008

14

Challenges and potential of new approaches for reliability assessment of nanotechnologies

Laurent Béchou, Yves Danto, Jean-Yves Deletage, Frédéric Verdier, Yannick Deshayes, Sébastien Fregonèse, Cristell Maneux, Thomas Zimmer, Dominique Laffitte

Journal:

Comptes Rendus Physique

Year:

2008

File:

PDF, 1.13 MB

2008

15

Reliability, Robustness and Failure Mechanisms of LED Devices || State-of-the-Art of Infrared Technology

Deshayes, Yannick

Year:

2016

File:

PDF, 4.77 MB

2016

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